February 15, 2010
Smart Imaging Technologies has introduced ChipInsight™, an image-based, full-chip validation tool for the production flow of post-RET design validation. The product will be presented at SPIE’s Advanced Lithography 2010 conference in San Jose, CA, 21 - 25 February 2010. |
January 30, 2008
Smart Imaging Technologies Receives 2008 Solution of the Year Award |
October 16, 2007
Smart Imaging Technologies Announces SIMAGIS Semi™: Award
Winning, Tool-Independent Suite of Automated Image Metrology
Applications Significantly Enhances Engineering Productivity
While Improving Quality Control Processes |
July 5, 2007
SIMAGIS® 3D by Smart Imaging Technologies received
R&D 100 Award by the R&D Magazine |
May 6, 2007
Smart Imaging Technologies received "Top 100" award by the Red Herring Magazine |
April 10, 2006
Smart Imaging
Technologies Secures Venture Funding by Aegis Texas Venture
Fund |
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Automated Image Analysis Methods for Characterization and Measurement of Nanomaterials
Our team is delivering set of lectures on software-based image analysis for Center for Biological and Environmental Nanotechnology (CBEN) at Rice University. Materials are available for download here:
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